Quantum Emitter Electron Nanomaterial Microscope (QuEEN-M)
The Quantum Emitter Electron Nanomaterial Microscope (QuEEN-M) is a next-generation platform for nanoscale cathodoluminescence (CL) imaging and ultrafast dynamic studies of quantum and functional materials, available through the CNM user program.
Enable Discoveries in Quantum and Functional Materials
The QuEEN-M supports research across quantum information science (QIS), microelectronics, nanophotonics, condensed matter physics, materials science, chemistry, and semiconductor engineering. The instrument integrates a probe-corrected, atomic-resolution scanning transmission electron microscope (STEM) with advanced analytical and optical capabilities, including CL spectroscopy, electron energy-loss spectroscopy, energy-dispersive X-ray spectroscopy, and 4D-STEM (EMPAD). The Attolight CL system employs a fiber-coupled parabolic mirror design decoupled from the sample holder. Time-resolved operation is enabled through a nanosecond electrostatic beam blanker and a picosecond RF-cavity-based ultrafast electron pulser, providing access to dynamic processes across broad temporal scales while maintaining sub-nanometer spatial resolution.
Major Capabilities:
- Correlative optical–structural microscopy: Direct correlation of nanoscale optical properties with atomic-scale structural features in quantum and functional materials.
- Electrical pump–probe operando studies: Electrical biasing for investigating carrier dynamics, switching behavior, and electrically induced light emission in devices.
- Optical pump–probe measurements: Laser-driven pulsed electron beam studies of light-induced dynamics and non-equilibrium processes.
Introduction to QuEEN-M
Future developments will further expand QuEEN-M’s ultrafast excitation, operando control, and multimodal spectroscopy capabilities. Mirror-coupled laser illumination will enable direct studies of light-induced structural, electronic, and optical dynamics. Advanced pump–probe methodologies will extend into near-atomic-resolution photon-induced near-field electron microscopy (PINEM), enabling deeper insight into light–matter interactions and transient electromagnetic fields.
In parallel, RF Electrical biasing excitation capabilities will support high-frequency operando studies of electrically driven phenomena, including domain motion, carrier transport, resistive switching, and device dynamics. Electrical biasing cathodoluminescence holder will enable electrically induced light emission. Together, these developments will establish QuEEN-M as a transformative platform for exploring non-equilibrium processes in quantum and functional materials.
Technical specifications:
- Spatial resolution: 0.07 nm (continuous beam), ~0.2 nm (pulsed beam)
- Temporal resolution: irreversible 1 ns, reversible ~0.4 ps
- Energy resolution: ~0.3 eV
- Cathodoluminescence range: 220 nm (5.63 eV) to 1000 nm (1.24 eV)
- Pump laser wavelengths: 1030, 515, 343nm (pulsed) 375nm/BYO Laser (CW)
- Repetition rate: Single shot–1MHz (fs laser); 75MHz (1030nm only); 1–1MHz (ns mode)
- Technical contacts: Jianguo Wen and Thomas Gage
